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[IEEE Industrial Engineering (CIE-40) - Awaji City, Japan (2010.07.25-2010.07.28)] The 40th International Conference on Computers & Indutrial Engineering - Review and classification of reliability statistical models exhibiting failure-free life characteristic

✍ Scribed by Halim, Tony; Muthusamy, Kanesan; Lam, Shao-Wei; Chia, Sie-Yong

Book ID: 118172137
Publisher: IEEE
Year: 2010
Weight: 205 KB
Volume: 0
Category: Article
ISBN: 1424472954
DOI: 10.1109/iccie.2010.5668387

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