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[IEEE IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2005. - Oulu, Finland (Aug. 1-4, 2005)] IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2005. - Microdevices for high resolution measurement

✍ Scribed by Manalis, S.; Burg, T.; Sparks, A.

Book ID: 121366786
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 195 KB
Category: Article
ISBN-13: 9780780392786
DOI: 10.1109/OMEMS.2005.1540084

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