๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches

โœ Scribed by Xiaobin Yuan, ; Hwang, J.C.M.; Forehand, D.; Goldsmith, C.L.


Book ID
115535781
Publisher
IEEE
Year
2005
Weight
422 KB
Volume
0
Category
Article
ISBN-13
9780780388468

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES