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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Distributed effects in high power RF LDMOS transistors

✍ Scribed by Goverdhanam, K.; Wenhua Dai, ; Frei, M.; Farrell, D.; Bude, J.; Safar, H.; Mastrapasqua, M.; Bambridge, T.

Book ID: 124085488
Publisher: IEEE
Year: 2005
Weight: 299 KB
Category: Article
ISBN-13: 9780780388468
DOI: 10.1109/MWSYM.2005.1516744

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