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[IEEE IEEE International Symposium on Power Semiconductor Devices and Integrated Circuits - Cambridge, UK (14-17 April 2003)] ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings. - Short circuit properties of Trench-/Field-Stop-IGBTs-design aspects for a superior robustness

✍ Scribed by Laska, T.; Miller, G.; Pfaffenlehner, M.; Turkes, P.; Berger, D.; Gutsmann, B.; Kanschat, P.; Munzer, M.

Book ID: 111958832
Publisher: IEEE
Year: 2003
Weight: 311 KB
Edition: 2003
Volume: 0
Category: Article
ISBN-13: 9780780378766
DOI: 10.1109/ispsd.2003.1225252

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