✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - Soft error rate and stored charge requirements in advanced high-density SRAMs

✍ Scribed by Lage, C.; Burnett, D.; McNelly, T.; Baker, K.; Bormann, A.; Dreier, D.; Soorholtz, V.

No coin nor oath required. For personal study only.

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