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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Characterization of multi-bit soft error events in advanced SRAMs

✍ Scribed by Maiz, J.; Hareland, S.; Zhang, K.; Armstrong, P.

No coin nor oath required. For personal study only.

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