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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Experimental/numerical investigation on current collapse in AlGaN/GaN HEMT's

โœ Scribed by Verzellesi, G.; Pierobon, R.; Rampazzo, F.; Meneghesso, G.; Chini, A.; Mishra, U.K.; Canali, C.; Zanoni, E.


Book ID
121753484
Publisher
IEEE
Year
2002
Weight
245 KB
Category
Article
ISBN-13
9780780374621

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