✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Experimental characterization of stiction due to charging in RF MEMS

✍ Scribed by van Spengen, W.M.; Puers, R.; Mertens, R.; De Wolf, I.

No coin nor oath required. For personal study only.

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