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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - A 0.18 μm 4Mb toggling MRAM

✍ Scribed by Durlam, M.; Addie, D.; Akerman, J.; Butcher, B.; Brown, P.; Chan, J.; DeHerrera, M.; Engel, B.N.; Feil, B.; Grynkewich, G.; Janesky, J.; Johnson, M.; Kyler, K.; Molla, J.; Martin, J.; Nagel, K.; Ren, J.; Rizzo, N.D.; Rodriguez, T.; Savtchenko, L.; Salter, J.; Slaughter, J.M.; Smith, K.; Sun, J.J.; Lien, M.; Papworth, K.; Shah, P.; Qin, W.; Williams, R.; Wise, L.; Tehrani, S.

Book ID: 121793969
Publisher: IEEE
Year: 2003
Weight: 317 KB
Edition: 1
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/IEDM.2003.1269448

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