𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - A high power Tx/Rx switch IC using AlGaN/GaN HFETs

✍ Scribed by Ishida, H.; Hirose, Y.; Murata, T.; Kanda, A.; Ikeda, Y.; Matsuno, T.; Inoue, K.; Uemoto, Y.; Tanaka, T.; Egawa, T.; Ueda, D.

Book ID: 121256428
Publisher: IEEE
Year: 2003
Weight: 220 KB
Edition: 1
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/IEDM.2003.1269350

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Organic semiconductor RFID transponders

✍ Baude, P.F.; Ender, D.A.; Kelley, T.W.; Haase, M.A.; Muyres, D.V.; Theiss, S.D. 📂 Article 📅 2003 🏛 IEEE ⚖ 305 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Reliability issues for high-k gate dielectrics

✍ Oates, A.S. 📂 Article 📅 2003 🏛 IEEE ⚖ 327 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Inversion channel mobility in high-κ high performance MOSFETs

✍ Ren, Z.; Fischetti, M.V.; Gusev, E.P.; Cartier, E.A.; Chudzik, M. 📂 Article 📅 2003 🏛 IEEE ⚖ 283 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Scaling analysis of phase-change memory technology

✍ Pirovano, A.; Lacaita, A.L.; Benvenuti, A.; Pellizzer, F.; Hudgens, S.; Bez, R. 📂 Article 📅 2003 🏛 IEEE ⚖ 289 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Substrate transfer: enabling technology for RF applications

✍ Dekker, R.; Dessein, K.; Fock, J.-H.; Gakis, A.; Jonville, C.; Kuijken, O.M.; Mi 📂 Article 📅 2003 🏛 IEEE ⚖ 330 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Device design considerations for ultra-thin SOI MOSFETs

✍ Doris, B.; Ieong, M.; Zhu, T.; Zhang, Y.; Steen, M.; Natzle, W.; Callegari, S.; 📂 Article 📅 2003 🏛 IEEE ⚖ 289 KB