𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - A complementary BiCMOS technology with high speed npn and pnp SiGe:C HBTs

✍ Scribed by Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Formanek, P.; Fursenko, O.; Glante, M.; Glowatzki, K.; Gregor, A.; Haak, U.; Hoppner, W.; Knoll, D.; Kurps, R.; Marschmeyer, S.; Orlowski, S.; Rucker, H.; Schley, P.; Schmidt, D.; Scholz, R.; Winkler, W.; Yamamoto, Y.

Book ID: 120616341
Publisher: IEEE
Year: 2003
Weight: 242 KB
Edition: 1
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/IEDM.2003.1269179

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - SiGe:C BiCMOS technology with 3.6 ps gate delay

✍ Rucker, H.; Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Haak, U.; Hoppner, W 📂 Article 📅 2003 🏛 IEEE ⚖ 230 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Organic semiconductor RFID transponders

✍ Baude, P.F.; Ender, D.A.; Kelley, T.W.; Haase, M.A.; Muyres, D.V.; Theiss, S.D. 📂 Article 📅 2003 🏛 IEEE ⚖ 305 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Scaling analysis of phase-change memory technology

✍ Pirovano, A.; Lacaita, A.L.; Benvenuti, A.; Pellizzer, F.; Hudgens, S.; Bez, R. 📂 Article 📅 2003 🏛 IEEE ⚖ 289 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Substrate transfer: enabling technology for RF applications

✍ Dekker, R.; Dessein, K.; Fock, J.-H.; Gakis, A.; Jonville, C.; Kuijken, O.M.; Mi 📂 Article 📅 2003 🏛 IEEE ⚖ 330 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Advancements in complementary carbon nanotube field-effect transistors

✍ Javey, A.; Qian Wang, ; Woong Kim, ; Hongjie Dai, 📂 Article 📅 2003 🏛 IEEE ⚖ 282 KB

[IEEE IEEE International Electron Device

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Reliability issues for high-k gate dielectrics

✍ Oates, A.S. 📂 Article 📅 2003 🏛 IEEE ⚖ 327 KB