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[IEEE IEEE Holm Conference on Electrical Contacts - Pittsburgh, PA, USA (27-29 Sept. 1993)] Proceedings of IEEE Holm Conference on Electrical Contacts - Evaluation of contact surface configuration with a scanning laser microscope

✍ Scribed by Niizuma, K.; Hasegawa, M.

Book ID: 121327126
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 603 KB
Category: Article
ISBN-13: 9780780312708
DOI: 10.1109/HOLM.1993.489683

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