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[IEEE IEEE Holm Conference on Electrical Contacts - Pittsburgh, PA, USA (27-29 Sept. 1993)] Proceedings of IEEE Holm Conference on Electrical Contacts - Relationship between applied voltage to cause discharge and movement of carriers for rhodium-plated contact reed switches

✍ Scribed by Hinohara, K.; Nakamura, K.; Kobayashi, T.; Miyata, T.

Book ID: 121278046
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 295 KB
Category: Article
ISBN-13: 9780780312708
DOI: 10.1109/HOLM.1993.489691

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