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[IEEE IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Monterey, CA, USA (2005.06.20-2005.06.23)] IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Statistical Properties of Broadband ELF Electric Field Fluctuations Associated with Ion Acceleration and Outflow as Observed by the Fast Satellite

โœ Scribed by Bonnell, John W.; Bosch, James


Book ID
126653307
Publisher
IEEE
Year
2005
Weight
522 KB
Category
Article
ISBN-13
9780780393004

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