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[IEEE IEEE Conference on Nanotechnology - San Francisco, CA, USA (12-14 Aug. 2003)] 2003 Third IEEE Conference on Nanotechnology, 2003. IEEE-NANO 2003. - Evaluation of size and its distribution of InP nanowires using small angle X-ray scattering and X-ray diffraction at the grazing condition

โœ Scribed by Kawamura, T.; Bhunia, S.; Watanabe, Y.; Fujikawa, S.; Tokushima, K.; Matsui, J.; Kagoshima, Y.; Tsusaka, Y.


Book ID
118049165
Publisher
IEEE
Year
2003
Tongue
English
Weight
270 KB
Volume
2
Category
Article
ISBN-13
9780780379763

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