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[IEEE IEEE Compound Semiconductor Integrated Circuit Symposium. 2004 IEEE CISC Symposium - Monterey, CA, USA (24-27 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - High reliability high voltage HBTs operating up to 30 V

✍ Scribed by Henderson, T.; Hitt, J.; Campman, K.

Book ID: 126675886
Publisher: IEEE
Year: 2004
Weight: 212 KB
Category: Article
ISBN-13: 9780780386167
DOI: 10.1109/CSICS.2004.1392492

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