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[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - MATE compliant portable test technology emerges

✍ Scribed by Wood, C.T.

Book ID: 126652529
Publisher: IEEE
Year: 1989
Weight: 422 KB
Category: Article
DOI: 10.1109/AUTEST.1989.81122

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