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[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - BIT and testability for millimeter wave systems

✍ Scribed by Gillespie, D.W.; Wilkinson, K.D.; Merrell, B.

Book ID: 126620210
Publisher: IEEE
Year: 1989
Weight: 624 KB
Category: Article
DOI: 10.1109/AUTEST.1989.81129

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