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[IEEE IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging - West Point, NY, USA (26-28 Oct. 1998)] IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.98TH8370) - Model reduction for PEEC models including retardation

✍ Scribed by Cullum, J.; Ruehli, A.E.; Zhang, T.

Book ID: 126468054
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 287 KB
Category: Article
ISBN-13: 9780780349650
DOI: 10.1109/EPEP.1998.734055

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