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[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - Effect of CMOS device sizing on circuit noise performance

✍ Scribed by Noori, Hossein; Dai, Fa Foster

Book ID: 118194973
Publisher: IEEE
Year: 2012
Weight: 786 KB
Category: Article
ISBN: 1467324205
DOI: 10.1109/iecon.2012.6389028

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