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[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - A smart monitor for measurement and fault detection

✍ Scribed by Kadik, Andrew; Wang, Wilson

Book ID: 120230594
Publisher: IEEE
Year: 2012
Weight: 1020 KB
Category: Article
ISBN: 1467324205
DOI: 10.1109/IECON.2012.6389277

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