[IEEE IECON 2009 - 35th Annual Conference of IEEE Industrial Electronics (IECON) - Porto, Portugal (2009.11.3-2009.11.5)] 2009 35th Annual Conference of IEEE Industrial Electronics - The combined use of the instantaneous fault frequency evolution and frequency sliding for advanced rotor fault diagnosis in DFIM under time-varying condition

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Luna, A.; Rolan, A.; Medeiros, G.; Rodriguez, P.; Teodorescu, R. 📂 Article 📅 2009 🏛 IEEE ⚖ 558 KB

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Chen, Nan; Chung, Henry Shu-hung 📂 Article 📅 2009 🏛 IEEE ⚖ 539 KB

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Kara, Kamel; Hadjili, Mohamed Laid; eddine Hemsas, Kamel; Missoum, Tedjeddine 📂 Article 📅 2009 🏛 IEEE ⚖ 383 KB

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Lee, Jin-Shyan; Chuang, Chun-Chieh 📂 Article 📅 2009 🏛 IEEE ⚖ 530 KB

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Pinto, R. A.; Cosetin, M. R.; da Silva, M. F.; Denardin, G. W.; Fraytag, J.; Cam 📂 Article 📅 2009 🏛 IEEE ⚖ 705 KB

[IEEE IECON 2009 - 35th Annual Conferenc

✍ Andreu, Jon; Kortabarria, Inigo; Ibarra, Edorta; de Alegria, Inigo Martinez; Rob 📂 Article 📅 2009 🏛 IEEE ⚖ 906 KB