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[IEEE IECON 2009 - 35th Annual Conference of IEEE Industrial Electronics (IECON) - Porto, Portugal (2009.11.3-2009.11.5)] 2009 35th Annual Conference of IEEE Industrial Electronics - Development of a Petri net-based fault diagnostic system for industrial processes

✍ Scribed by Lee, Jin-Shyan; Chuang, Chun-Chieh

Book ID: 120008552
Publisher: IEEE
Year: 2009
Weight: 530 KB
Category: Article
ISBN: 1424446481
DOI: 10.1109/IECON.2009.5414911

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