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[IEEE IECON 2009 - 35th Annual Conference of IEEE Industrial Electronics (IECON) - Porto, Portugal (2009.11.3-2009.11.5)] 2009 35th Annual Conference of IEEE Industrial Electronics - Structural health monitoring: Subsurface defects detection

✍ Scribed by Leong, Wai Yie; Wei, Liu

Book ID: 118048296
Publisher: IEEE
Year: 2009
Weight: 569 KB
Volume: 0
Category: Article
ISBN: 1424446481
DOI: 10.1109/iecon.2009.5414919

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