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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Direct optical observation of polyethylene microstructures under field and temperature conditions, before any degradation

✍ Scribed by Bertin, C.; Guastavino, J.; Briot, M.; Campus, A.; Druot, P.

Book ID: 126758198
Publisher: IEEE
Year: 1998
Weight: 463 KB
Category: Article
ISBN-13: 9780780342378
DOI: 10.1109/ICSD.1998.709276

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