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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Electric charge 3-dimensional profile measurement in dielectrics using acoustic microscope probe head

โœ Scribed by Xiaokui Qin, ; Suzuki, K.; Sazaki, M.; Tanaka, Y.; Takada, T.


Book ID
126624073
Publisher
IEEE
Year
1998
Weight
548 KB
Category
Article
ISBN-13
9780780342378

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