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[IEEE IC's (ISPSD) - Orlando, FL, USA (2008.05.18-2008.05.22)] 2008 20th International Symposium on Power Semiconductor Devices and IC's - Time Dependent Isolation Capability of High Voltage Deep Trench Isolation

✍ Scribed by Lerner, Ralf; Eckoldt, Uwe; Schottmann, Klaus; Heinz, Steffen; Erler, Klaus; Lange, Andre; Ebest, Gunter


Book ID
120020071
Publisher
IEEE
Year
2008
Weight
476 KB
Category
Article
ISBN
1424415322

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