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[IEEE IC's (ISPSD) - Orlando, FL, USA (2008.05.18-2008.05.22)] 2008 20th International Symposium on Power Semiconductor Devices and IC's - Development of the 1200V FZ-diode with soft recovery characteristics by the new local lifetime control technique

✍ Scribed by Onozawa, Y.; Takahashi, K.; Nakano, H.; Nemoto, M.; Otsuki, M.; Ikawa, O.; Miyasaka, T.


Book ID
111863871
Publisher
IEEE
Year
2008
Weight
319 KB
Volume
0
Category
Article
ISBN
1424415322

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