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[IEEE IC's (ISPSD) - Barcelona, Spain (2009.06.14-2009.06.18)] 2009 21st International Symposium on Power Semiconductor Devices & IC's - Impact of an LPT(II) concept with Thin Wafer Process Technology for IGBT's vertical structure

✍ Scribed by Nakamura, Katsumi; Daisuke Oya, ; Saito, Shoji; Okabe, Hiroaki; Hatade, Kazunari

No coin nor oath required. For personal study only.

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