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[IEEE Forty-Seventh IEEE Holm Conference on Electrical Contacts - Montreal, Que., Canada (10-12 Sept. 2001)] Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) - Performance of microcontacts tested with a novel MEMS device

✍ Scribed by Bromley, S.C.; Nelson, B.J.

Book ID: 124102607
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 617 KB
Category: Article
ISBN-13: 9780780366671
DOI: 10.1109/HOLM.2001.953199

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