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[IEEE Forty-Seventh IEEE Holm Conference on Electrical Contacts - Montreal, Que., Canada (10-12 Sept. 2001)] Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) - Experimental study on 3-D analysis of contact surfaces with a digital scanning laser microscope

✍ Scribed by Hasegawa, M.; Makimoto, J.; Sawa, K.

Book ID: 121842244
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 659 KB
Category: Article
ISBN-13: 9780780366671
DOI: 10.1109/HOLM.2001.953193

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