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[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Use of interleaving and error correction to infrared patterns for the improvement of position estimation systems

โœ Scribed by Petrellis, N.; Gioulekas, F.; Birbas, M.; Kikidis, J.; Birbas, A.


Book ID
126694304
Publisher
IEEE
Year
2008
Weight
336 KB
Category
Article
ISBN
1424415055

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