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[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Using neural networks for quality management

✍ Scribed by Jaber, Mohamad; Combaz, Jacques; Strus, Loic

Book ID: 121200010
Publisher: IEEE
Year: 2008
Weight: 409 KB
Category: Article
ISBN: 1424415055
DOI: 10.1109/ETFA.2008.4638586

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