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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors

✍ Scribed by Lien, Wei-Cheng; Pisano, Albert P.; Tsai, Dung-Sheng; He, Jr-Hau; Senesky, Debbie G.

Book ID: 121681848
Publisher: IEEE
Year: 2012
Weight: 767 KB
Category: Article
ISBN: 1467317063
DOI: 10.1109/essderc.2012.6343376

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