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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - TCAD degradation modeling for LDMOS transistors

✍ Scribed by Reggiani, S.; Barone, G.; Gnani, E.; Gnudi, A.; Poli, S.; Chuang, M.-Y.; Tian, W.; Wise, R.

Book ID: 125462137
Publisher: IEEE
Year: 2012
Weight: 937 KB
Category: Article
ISBN: 1467317063
DOI: 10.1109/essderc.2012.6343364

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