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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

✍ Scribed by Romeo, T.; Pantisano, L.; Simoen, E.; Krom, R.; Togo, M.; Horiguchi, N.; Mitard, J.; Thean, A.; Groeseneken, G.; Claeys, C.; Crupi, F.

Book ID: 120067596
Publisher: IEEE
Year: 2012
Weight: 580 KB
Category: Article
ISBN: 1467317063
DOI: 10.1109/ESSDERC.2012.6343400

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