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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs

✍ Scribed by Lizzit, D.; Palestri, P.; Esseni, D.; Conzatti, F.; Selmi, L.

Book ID: 120067595
Publisher: IEEE
Year: 2012
Weight: 482 KB
Category: Article
ISBN: 1467317063
DOI: 10.1109/ESSDERC.2012.6343398

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