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[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - A compact NBTI model for accurate analog integrated circuit reliability simulation

✍ Scribed by Maricau, Elie; Zhang, Leqi; Franco, Jacopo; Roussel, Philippe; Groeseneken, Guido; Gielen, Georges

Book ID: 126717789
Publisher: IEEE
Year: 2011
Weight: 350 KB
Category: Article
ISBN: 1457707071
DOI: 10.1109/ESSDERC.2011.6044213

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