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[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation

✍ Scribed by Sahoo, Amit Kumar; Fregonese, Sebastien; Weis, Mario; Malbert, Nathalie; Zimmer, Thomas

Book ID: 117993048
Publisher: IEEE
Year: 2011
Weight: 635 KB
Volume: 0
Category: Article
ISBN: 1457707071
DOI: 10.1109/essderc.2011.6044190

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