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[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of isolation scheme on thermal resistance and collector-substrate capacitance of SiGe HBTs

✍ Scribed by You, Shuzhen; Decoutere, Stefaan; Van Huylenbroeck, Stefaan; Sibaja-Hernandez, Arturo; Venegas, Rafael; De Meyer, Kristin

Book ID: 120033034
Publisher: IEEE
Year: 2011
Weight: 837 KB
Category: Article
ISBN: 1457707071
DOI: 10.1109/ESSDERC.2011.6044189

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