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[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Grain boundary-driven leakage path formation in HfO2 dielectrics

✍ Scribed by Bersuker, G.; Yum, J.; Iglesias, V.; Porti, M.; Nafria, M.; McKenna, K.; Shluger, A.; Kirsch, P.; Jammy, R.

Book ID: 125841563
Publisher: IEEE
Year: 2010
Weight: 560 KB
Category: Article
ISBN: 142446658X
DOI: 10.1109/ESSDERC.2010.5618225

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