๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Drain current variability in 45nm heavily pocket-implanted bulk MOSFET

โœ Scribed by Mezzomo, Cecilia M.; Bajolet, Aurelie; Cathignol, Augustin; Ghibaudo, Gerard


Book ID
125457912
Publisher
IEEE
Year
2010
Weight
331 KB
Category
Article
ISBN
142446658X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES