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[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Impact of fast-recovering NBTI degradation on stability of large-scale SRAM arrays

✍ Scribed by Drapatz, Stefan; Hofmann, Karl; Georgakos, Georg; Schmitt-Landsiedel, Doris

Book ID: 121256404
Publisher: IEEE
Year: 2010
Weight: 418 KB
Category: Article
ISBN: 142446658X
DOI: 10.1109/ESSDERC.2010.5618438

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