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[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - The Curie temperature as a key design parameter of ferroelectric Field Effect Transistors

✍ Scribed by Salvatore, Giovanni A.; Lattanzio, Livio; Bouvet, Didier; Ionescu, Adrian M.

Book ID: 120267538
Publisher: IEEE
Year: 2010
Weight: 541 KB
Category: Article
ISBN: 142446658X
DOI: 10.1109/ESSDERC.2010.5618386

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