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[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - C-V characterization of MOS capacitors on high resistivity silicon substrate

✍ Scribed by Rong, B.; Nanver, L.K.; Burghartz, J.N.; Jansman, A.B.M.; Evans, A.G.R.; Rejaei, B.S.

Book ID: 120569113
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 247 KB
Category: Article
ISBN-13: 9780780379992
DOI: 10.1109/ESSDERC.2003.1256920

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