✦ LIBER ✦

[IEEE Device Research Conference - Santa Barbara, CA, USA (24-26 June 2002)] 60th DRC. Conference Digest Device Research Conference - Reliability and ESD for high voltage LDMOS with SenseFET

✍ Scribed by Choi, Y.S.; Kim, J.J.; Jeon, C.K.; Kim, M.H.; Kim, S.L.; Kang, H.S.; Song, C.S.

No coin nor oath required. For personal study only.

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