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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Fast Statistical Circuit Analysis with Finite-Point Based Transistor Model

✍ Scribed by Chen, Min; Zhao, Wei; Liu, Frank; Cao, Yu

Book ID: 123621267
Publisher: IEEE
Year: 2007
Tongue: German
Weight: 310 KB
Category: Article
ISBN: 3981080122
DOI: 10.1109/DATE.2007.364492

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