[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application

[IEEE Design, Automation & Test in Europ

✍ Chen, Min; Zhao, Wei; Liu, Frank; Cao, Yu 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 310 KB

[IEEE Design, Automation & Test in Europ

✍ Narayanan, Ramanathan (author);Honbo, Daniel (author);Memik, Gokhan (author);Cho 📂 Article 📅 2007 🏛 IEEE ⚖ 109 KB

[IEEE Design, Automation & Test in Europ

✍ Narayanan, Ramanathan (author);Honbo, Daniel (author);Memik, Gokhan (author);Cho 📂 Article 📅 2007 🏛 IEEE ⚖ 109 KB

[IEEE Design, Automation & Test in Europ

✍ Alam, Monjur; Ray, Sonai; Mukhopadhayay, Debdeep; Ghosh, Santosh; RoyChowdhury, 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 140 KB

[IEEE Design, Automation & Test in Europ

✍ Bloem, Roderick; Galler, Stefan; Jobstmann, Barbara; Piterman, Nir; Pnueli, Amir 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 110 KB

[IEEE Design, Automation & Test in Europ

✍ Chattopadhyay, A.; Ahmed, W.; Karuri, K.; Kammler, D.; Leupers, R.; Ascheid, G.; 📂 Article 📅 2007 🏛 IEEE 🌐 German ⚖ 119 KB