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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Analog and Digital Circuit Design in 65 nm CMOS: End of the Road?

✍ Scribed by Gielen, G.; Dehaene, W.; Christie, P.; Draxelmayr, D.; Janssens, E.; Maex, K.; Vucurevich, T.

Book ID: 121861470
Publisher: IEEE
Year: 2005
Weight: 352 KB
Category: Article
DOI: 10.1109/DATE.2005.64

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